Basic Electronics (View More...)
| Semiconductor Materials: Intrinsic and Extrinsic | lec1 | 18:39 to 21:27 | VIDEO | |
| Semiconductor Materials: Intrinsic and Extrinsic | lec1 | 27:33 to 29:17 | VIDEO | |
| PN Junction Diodes | lec2 | 20:44 to 24:00 | VIDEO |
Probability and Statistics (View More...)
| Descriptive Statistics I | lec25 | 01:22 to 05:39 | VIDEO | |
| Descriptive Statistics I | lec25 | 05:39 to 11:44 | VIDEO | |
| Descriptive Statistics I | lec25 | 11:44 to 15:37 | VIDEO |
Solid State Devices (View More...)
| Carrier Transport (Contdâ¦) | lec14 | 15.06 to 16:07 | VIDEO | |
| Procedure for Device Analysis | lec17 | 02:51 to 4:00 | VIDEO | |
| Procedure for Device Analysis (Contd..) | lec18 | 38:44 to 39:22 | VIDEO |
Digital Voice and Picture Communication (View More...)
| Introduction | lec1 | 33:28 to 36:26 | VIDEO | |
| Introduction | lec1 | 36:26 to 40:22 | VIDEO | |
| Speech Production Model | lec2 | 15:33 to 21:11 | VIDEO |
MEMS and Microsystems (View More...)
| Mems Inertial Sensors | lec20 | 42:28 to 50:07 | VIDEO | |
| Micromachined Micrometer for MEMS | lec21 | 23:09 to 27:46 | VIDEO | |
| MEMS Capacitive Accelerometer | lec25 | 09:28 to 12:11 | VIDEO |
VLSI Technology (View More...)
| Oxidation I Kinetics of Oxidation | lec11 | 11:09 to 15:07 | VIDEO | |
| Oxidation I Kinetics of Oxidation | lec11 | 5:56 to 9:59 | VIDEO | |
| Oxidation IV Oxide Charges and Oxidation Systems | lec14 | 6:22 to 10:36 | VIDEO |
High Speed Devices and Circuits (View More...)
| Metal Semiconductor contacts (contd.) | lec14 | 07:28 to 16:32 | VIDEO | |
| Metal Semiconductor contacts (contd.) | lec14 | 41:31 to 47:49 | VIDEO | |
| Causes of Non-Idealities in the Schottky Barrier Diodes I-V Characteristics | lec19 | 04:39 to 07:22 | VIDEO |